Rare earth elements (REEs) have unique physical and chemical properties that make them essential for many modern technologies, such as magnets, catalysts, batteries, lasers, displays, and sensors. However, REEs are also scarce and unevenly distributed in the Earth’s crust, making their extraction and processing challenging and costly. Therefore, it is important to develop accurate and efficient methods for the analysis of REEs in various materials, such as ores, concentrates, alloys, and waste streams.
Energy dispersive X-ray fluorescence (ED-XRF) is a method that can be used for the analysis of REEs. It can provide qualitative and quantitative information about the elemental composition of a sample, including the REEs, without the need for sample preparation or chemical separation. ED-XRF has several advantages over other techniques, such as lower cost, higher speed, and simpler operation.
This XRF report shows that the SPECTRO XEPOS ED-XRF is very well suited for the analysis of rare-earth-elements (REE).
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