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网络研讨会
Is There an Alternative to the Classical Dual-View Technique?
Description
In this webinar, Olaf Schulz,
ICP-OES
Product Manager, talks about the Dual Side-on Interface (DSOI) plasma observation approach, which likely has the potential to replace the classical dual view technique as it provides the same performance and eliminates the disadvantages.
The dual side-on interface (DSOI) technology puts the challenge of plasma viewing in a whole new light. It can provide sensitivity, freedom from interference, and matrix compatibility while avoiding the earlier design’s drawbacks. This marks a revolutionary improvement. DSOI enables radial-view-based analyzers to deliver previously unachievable levels of performance and ease in a wide variety of applications.
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Is There an Alternative to the Classical Dual-View Technique?
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