Elemental analysis is a cornerstone of quality assurance and process optimization in the chemical industry. However, traditional methods often struggle with complex sample matrices, contamination risks, and the need for hazardous reagents. Energy Dispersive X-ray Fluorescence (ED-XRF) offers a non-destructive, efficient alternative that addresses these challenges—particularly in applications involving difficult-to-digest materials or trace-level detection of halogens and other elements.
XRF technology enables direct analysis of solids and liquids, minimizing sample preparation and reducing the risk of cross-contamination. Its broad elemental range—from fluorine to uranium—makes it suitable for diverse applications, including the quantification of silicon in polyamides, alumina and silica in titanium dioxide, and halogens in solvents and powders. Compared to ICP-OES and ICP-MS, XRF provides a streamlined workflow with high sensitivity and repeatability, especially in high-throughput environments.
The SPECTRO XEPOS ED-XRF system enhances analytical performance through advanced excitation techniques and tailored filters, delivering full elemental analysis in approximately 10 minutes. Designed for industrial use, it supports compliance with standards like EN 15309 and ISO 18227, and is backed by expert support from SPECTRO.
Why download this application brief?
- Learn how XRF simplifies elemental analysis in complex chemical matrices
- Discover real-world case studies demonstrating accuracy and efficiency
- Explore how SPECTRO XEPOS streamlines the analytical workflow
Download the full document now to see how ED-XRF can transform your laboratory workflows and elevate your analytical capabilities.