Manufacturers of inductively coupled plasma optical emission spectrometers keep refining their designs. In particular, ongoing innovations implemented in recent ICP-OES models seek to optimize their plasma viewing technologies to improve performance, efficiency, and ease of use.
This paper compares two recent developments. Vertical-torch dual-view plasma observation has demonstrated benefits such as reduced interferences and higher matrix compatibility. However, its design also suffers from issues of contamination plus higher requirements for maintenance, adding complexity and cost that can limit its usefulness.
By contrast, newer dual side-on interface (DSOI) technology — as seen in the SPECTROGREEN ICP-OES analyzer — puts the challenge of plasma viewing in a whole new light. It can provide sensitivity, freedom from interference, and matrix compatibility while avoiding the earlier design’s drawbacks. This marks a revolutionary improvement. DSOI enables radial-view-based analyzers to deliver previously unachievable levels of performance and ease in a wide variety of applications.
