选择区域[语言]

本网站在其他国家/地区的版本：

斯派克附属公司网站

国际网站
中国网站
德国网站
日本网站

斯派克代表网站

产品
- 概述
- ICP-OES光谱仪
  - 斯派克旗舰级SPECTRO ARCOS型ICP光谱仪定义元素分析新高度
    
    垂直双观测结构（DSOI）提升了灵敏度，同时降低了样品基体效应
    
    以一当二：市场上唯一炬管即可垂直又可水平放置的主机，可快速切换以满足真正的双向观测要求
    
    ORCA光路结构：同时读取130-770nm谱线信号，和通常的中阶梯光栅+棱镜交叉色散的光学系统相比，光强度信号最高提升5倍，紫外/远紫外区的灵敏度提高无与伦比
    SPECTRO ARCOS
  - SPECTROGREEN革命性新突破
    垂直同步双观测技术（DSOI）
    
    DSOI技术提供数倍于传统垂直观测系统的信号强度
    
    TI技术带来的高灵敏度，能够实现对痕量元素进行测量，即使在充满挑战性的环境基体也能确保准确度，避免基体干扰。
    
    响应极其敏锐的LDMOS发生器无需额外的外部水冷装置
    
    新设计的软件系统简洁直观易于使用
    SPECTROGREEN
  - 就是如此简单！原子吸收光谱法和顺序型ICP的真正替代技术
    
    用于液体元素分析的全谱ICP-OES分析
    
    波长范围：175-770 nm
    
    低成本
    
    直观操作
    SPECTRO GENESIS
  - 软件
  - 附件
- XRF 台式分析仪
  - 用于多元素分析的高性能XRF光谱仪
    
    主要、次要和痕量水平的先进元素分析
    
    杰出的灵敏度和检出限——带来卓越的精度和准确度
    
    不同版本适用于各种应用的最大化性能
    SPECTRO XEPOS
  - SPECTROCUBE ED-XRF 分析仪
    
    同类产品中测试速度之冠：是典型测试速度的两倍，高精度分析仅需15秒
    
    分析范围宽和准确性高：一次分析，同时检定30多种元素, 包括痕量元素
    
    整机无与伦比的易用性：只需简单的三步，即可得到精确的、完美的全分析结果
    SPECTROCUBE
  - 小焦点ED-XRF光谱仪，为贵金属测试而优化
    
    市场公认的贵金属分析权威标准
    
    涵盖元素种类最多，丰富的工厂校准，确保对痕量和主要含量检测的最佳准确度
    
    最快的测量时间：选择以传统测量时间获得优越结果，或以优越测试时间获得传统结果
    SPECTRO MIDEX
  - 为野外和临线应用提供快速可靠的实验室级分析
    
    覆盖从百万分之一到百分之一含量的多种元素
    
    传统轻量便携性，坚固且节省空间的设计
    
    提供用户定制校准和先进的预校准应用包
    
    独特的iCAL标准化过程，使用一份一体化样本，需时不到5分钟
    SPECTROSCOUT
  - 基于SDD的手持式ED-XRF光谱仪系列
    
    从锰到铀等所有主要元素仅需几秒钟
    
    分析, PMI, 品级鉴别，分拣, 环境与合规筛查
    
    很多应用仅需几秒即可获得实验室级结果
    
    全面的安全特点和功能
    SPECTRO xSORT
  - XRF仪器选择工具
  - 附件
- 移动式金属分析仪
  - 市场领先的移动式金属分析仪
    
    分析时间短：分拣模式2秒，分析模式5秒起
    
    使用电弧和火花激发测定碳含量
    
    使用UV激发枪分析碳、磷、硫、氮、硼和其他元素
    
    适用电弧和火花激发的所有激发枪
    SPECTROTEST
  - 对不能承担金属错误损失的您来说是一个简单选择
    
    便捷的分析模式
    
    突破性的新自调整光学系统
    
    独特的iCAL 2.0：单样本完成整个系统的标准化
    
    简化软件，插件扩展能力
    SPECTROPORT
  - 基于SDD的手持式ED-XRF
    
    从锰到铀等所有主要元素仅需几秒钟
    
    分析, PMI, 品级鉴别，分拣, 环境与合规筛查
    
    很多应用仅需几秒即可获得实验室级结果
    
    全面的安全特点和功能
    SPECTRO xSORT
  - 工作原理
  - 附件
- 直读光谱仪
  - 高端金属分析真正意义上的革命
    
    分析结果准确度高
    
    定期维护工作量少
    
    优异的检出限
    
    仪器的占地面积减少27%
    
    iCAL 2.0 单一标样实现整个系统的标准化
    SPECTROLAB S
  - 完美无瑕的金属分析！
    
    特有的iCAL 2.0单标样标准化专有技术 – 补偿温度波动造成的漂移，平均每天节省30分钟标准化时间
    
    与前代产品相比，检出限提高了30%-40%（例如：铁、铝和铜基）
    
    与之前的型号相比，在待机期间减少了高达64%的氩气消耗
    
    适用于所有原材料和成品的日常分析和精确定量，以及冶炼铸造过程控制(包括氮元素分析) – 覆盖10个标准基体，68类德国原厂工作曲线和59种元素
    SPECTROMAXx
  - 以最低价格水平提供最高性能和可靠性
    
    无忧分析
    
    超可靠结果
    
    长期可用性
    
    iCAL逻辑免除昂贵的重新校准
    
    最佳价格/性能比
    SPECTROCHECK
  - 工作原理
行业
资源库
支持
网店
关于我们
工作机会
联系我们

直读光谱仪

SPECTROLAB S
SPECTROMAXx
SPECTROCHECK
工作原理

德国斯派克分析仪器公司 »
产品 »
直读光谱仪 »
SPECTROLAB S »

SPECTROLAB S

SPECTROLAB S – 高端金属分析真正意义上的革命

概述 +
- 20秒内获得高准确度的结果（例如：低合金钢）
- 定期维护的工作量（火花台清洗）减少8倍
- 元素在低合金钢中平均检测限改善2倍，元素在纯铝中的平均检测限改善5倍
- 仪器的占地面积减少27%
- 单一标样实现整个系统的标准化, 此项每天可节省30分钟工作时间
作为电弧/火花创新技术的领导者，40多年来，SPECTRO全心投入开发出世界领先的发射光谱仪。今天，斯派克公司完美引入CMOS探测器技术，彻底改变了高端电弧/火花分析技术的走向及未来。在所有同类分析仪中，SPECTROLAB S所提供分析速度超出想象，元素检测限低至极限，同时她也可以提供超长的正常运行时间和非常具有前瞻性的灵活性。

SPECTROLAB S 拥有世界上第一个基于CMOS的探测器的记录系统，该系统非常适合于高端金属分析。从微量元素到多基体应用，它提供了极其快速、高度准确、异常灵活的技术选择。

样品的分析速度是仪器先进性的重要标志，SPECTROLAB S的推出完全满足了金属分析市场对速度的需求。例如：当检测低合金钢时，它可以在20秒或更短的时间内提供高准确度的测量值！

从技术指标和实际使用效果看，SPECTROLAB S均是目前金属冶炼厂首选的、高性能的光谱仪。对于金属再加工生产商、汽车和航空航天制造商、以及成品和半成品、电子产品、半导体等制造商来说，她给出的解决方案同样出色。
按需举行的网络研讨会 +

您可以在我们的资源库中找到与SPECTROLAB S相关的网络研讨会。
视频 +
观看SPECTROLAB S的视频演示? 或点击此处切换到YouTube.com上的斯派克页面。
- {2}
  
  {3}
- SPECTROLAB S – 高端金属分析真正意义上的革命
- 分析铸铁中的碳
样本 +
- SPECTROLAB S（PDF, 英文）
- SPECTRO Overview Brochure（PDF,英文）
- Case Study Voestalpine PDF,英文）
- 使用先进OES技术分析铸铁中的碳含量
白皮书 +
- Whitepaper: Standards-Compliant Elemental Analysis: Does Your Testing Meet Today’s Requirements? (PDF, en)
Many users are currently being audited for the first time according to the new versions of ISO 9001 and IATF 16949. These are IATF 16949:2016 and ISO 9001:2015. The deadlines up to which work could be carried out according to the previous versions of the standards elapsed almost simultaneously on September 14th, 2018 (ISO 9001) and September 16th, 2018 (IATF16949).

Both standards are characterized by the fact that, compared with their predecessors, they place increased demands on the performance of measurements and tests. These intensifications are reasonable. By following these rules, the risk of giving “incorrect” results is significantly decreased. Such errors can have considerable consequences such as accidents resulting in damage to material and personnel, product recalls, etc. A logical system for avoiding incorrect results must therefore be welcomed.

The key points of the standard requirements are outlined in this paper. Compliance to the cited standards ensures working according to the state of the art. It is beneficial to be able to prove this in the event of damage or loss. Learn more in this informative whitepaper!

Click here to download this document
- Whitepaper: PMT vs. CMOS - The Paradigm Shift in Metal Analyzer Detector Technologies (PDF, en)
Advanced complementary metal oxide semiconductor (CMOS) detectors made with proven integrated circuit technology have been developed for a new class of analyzers. These equal or exceed every benchmark of PMT-based performance. Example: they render reliable results on a greatly expanded number of matrices, elements, and compounds, and can add new ones via simple software updates.

That’s good news for large foundries and primary producers of steel, aluminum, or copper — as well as secondary metal processors, aerospace and automotive companies, testing laboratories, and governmental or academic labs. A new white paper details PMT issues as well as CMOS-based flexibility, sensitivity, stability, speed, and more.

Click here to request this document
*** 请登录以下载白皮书
应用 +
应用报告
- MMA-16: Cast Iron Analysis Using Spark OES
Cast iron alloys must be accurately identified and verified to meet the chemical composition specified by a customer or an industry. The production or use of unsuitable alloy cast iron carry the risk that for example the subsequent production process does not run correctly or that the components produced do not meet the customer’s requirements. Expensive rework, recalls or total loss of orders could be the result.

Mobile and stationary instruments can be used to analyze cast iron. To monitor a melting process, a stationary instrument must be used as the precision for carbon is higher than with a mobile instrument. For analyses in the field or a huge and heavy sample geometry, a mobile instrument can be extremely handy. The results are precise enough to determine the main elements carbon and silicon. For analyzing cast iron samples, whether it is a mobile or a stationary metal analyzer, an optimized method is used: Cast iron requires a much longer pre-spark time. The method is named Fe-20 or Fe-20MO on a mobile metal analyzer.

This application report shows how mobile and stationary spark OES instruments can be used to analyze cast iron. Differences in the performance of the two instrument categories are also shown, so that the appropriate metal analyzer can be selected depending on the requirements.

Click here to download this paper
- SMA-70: The Analysis of Iron and Steel with SPECTROLAB-S
The all new SPECTROLAB S01 represents the next generation of stationary metal analyzer equipped with the next advanced semiconductor detector technology (CMOS) available. This innovative step improves the analytical performance and offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options have been the left two advantages of PMT (photo multiplier tube) due to the high dynamic range offered. Modifications regarding read-out and excitation system in combination with SPECTRO’s proprietary CMOS+T technology have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of iron and steel and its alloys.

Click here to request this paper.
- SMA-71: The Analysis of Aluminum with SPECTROLAB-S
The all new SPECTROLAB S01 represents the next generation of stationary metal analyzer equipped with the next advanced semiconductor detector technology (CMOS) available. This innovative step improves the analytical performance and offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options have been the left two advantages of PMT (photo multiplier tube) due to the high dynamic range offered. Modifications regarding read-out and excitation system in combination with SPECTRO’s proprietary CMOS+T technology have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of Aluminium and its alloys.

Click here to request this paper.
- SMA-72: The Analysis of Copper with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of copper and its alloys.

Click here to request this paper.
- SMA-73: The Analysis of Nickel with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of nickel and its alloys.

Click here to request this paper.
- SMA-74: The Analysis of Zinc with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of zinc and its alloys.

Click here to request this paper.
- SMA-75: The Analysis of High-Purity Zinc with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of high-purity zinc.

Click here to request this paper.
- SMA-76: The Analysis of Lead with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of lead and its alloys.

Click here to request this paper.
- SMA-77: The Analysis of High-Purity Aluminium with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of high-purity aluminium.

Click here to request this paper.
- SMA-78: The Analysis of High-Purity Lead with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of high-purity lead.

Click here to request this paper.
- SMA-79: The Analysis of Tin with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of tin and its alloys.

Click here to request this paper.
- SMA-80: The Analysis of Cobalt with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of cobalt and its alloys.

Click here to request this paper.
- SMA-81: The Analysis of High-Purity Copper with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of high-purity copper.

Click here to request this paper.
- SMA-82: The Analysis of Magnesium and its Alloys with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of magnesium and its alloys.

Click here to request this paper.
- SMA-83: The Analysis of Titanium and its Alloys with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of titanium and its alloys.

Click here to request this paper.
- SMA-84: The Analysis of High-Purity Gold with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of high-purity gold.

Click here to request this paper.
- SMA-85: The Analysis of High-Purity Silver with SPECTROLAB-S
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation). These two options were the remaining two advantages of PMT (photo multiplier tube) detectors.

Modifications regarding read-out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

This report shows the capabilities of the new SPECTROLAB S for the analysis of high-purity silver.

Click here to request this paper.
- SMA-86: Detection and Analysis of Inclusions Using Single Spark Evaluation Technology
The all new SPECTROLAB S represents the next generation of stationary metal analyzer equipped with advanced semiconductor detector technology combined with additional time resolved measurement capabilities (CMOS+T). This innovative step improves the analytical performance and also offers the ability of TRS (time resolved spectroscopy) and SSE (single spark evaluation).

These two options were the remaining two advantages of PMT (photo multiplier tube) detectors. Modifications regarding read out and excitation system in combination with improved CMOS detector capabilities have overcome these final technical / analytical limitations.

Click here to request this paper.
- SMA-99: Analytical Solutions for Aluminum Recycling
Recycling aluminum (Al) alloys increasingly helps shape a sustainable economy, offering both environmental and financial benefits. Aluminum alloys can be reprocessed many times without losing useful properties. Additionally, recycling uses only 5 % of the energy required to extract and refine new aluminum.

Specialized aluminum alloys — developed for applications such as aviation, transportation, medical, piping, defense, communications and automotive — command premium prices. Supply chain fluctuations can impact price and availability; for example, a magnesium (Mg) shortage has recently affected production of aluminum grades that require this alloying element.

It’s therefore important for recyclers, refiners/remelters, producers, and end users to ascertain exact elemental compositions in incoming scrap streams, in-process grades, and finished products. This report highlights classes of elemental analyzers that can provide easy identification and measurement of aluminum alloys.

Click here to request this document
*** 请登录以请求应用报告
更多信息 +
点击如下链接以进一步探索SPECTROLAB S。
- 新闻稿
- 新闻图片

产品
行业
- 概述
- 采矿与地质化学
- 金属
- 化工
- 环境
- 电子
- 石油
- 聚合物
- 服务
- 学术
- 地质学
- 运输
- 农业
- 水泥
- 食品
- 化妆品
- 药品
支持
网店
关于我们

联系我们

订阅新闻通讯

Please fill a valid Email address!

关注我们

全国统一销售热线：
400 022 7699

Cookie 政策
隐私政策
帐户
Ametek.com
退订
法律声明
条款
版权

© 2023斯派克分析仪器公司版权所有 | 京ICP备09048995号-11

MacCMS