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行业

采矿与地质化学

Mining Geochem

行业

采矿-地质化学

在采矿和地质化学领域，斯派克的先进分析仪独领风骚

SPECTRO ARCOS ICP-OES

顶级的 SPECTRO ARCOS ICP-OES 分析仪将元素分析提升到一个新的水平

SPECTRO XEPOS

以杰出新性能水平重新定义ED-XRF分析的ED-XRF光谱仪

SPECTROLAB

新一代金属分析的顶级性能

SPECTRO xSORT Family

为高样品量测试和光谱化学分析而设计的手持式XRF

SPECTROSCOUT two instruments

将实验室级分析带到野外或生产车间的便携式ED-XRF光谱仪

应用报告和白皮书

Iron Ore and Iron Sinter

铁矿石和铁烧结矿中次要成分的分析

Cover Biogeochemistry Report

Application Brief

Bio-Geochemistry: Analyzing Trace Elements in Sediment Using ED-XRF

Minerals Containing Fluorspar

Application Brief

Analysis of Minerals Containing Fluorspar – Screening of Fluorine Content by ED-XRF

Iron Ore and Iron Sinter

Application Brief

Analysis of Secondary Components in Iron Ore and Iron Sinter

Analysis of Nickel Ore

Application Brief

Analysis of Nickel Ore by ICP-OES with Dual-Side-On Plasma Observation

Comparing ICP-OES Analyzers

Comparing ICP-OES Analyzers’ Plasma Views: Axial, Radial, Dual, MultiView, and New Dual Side-On Interface

4 Reasons to Upgrade

What do you need in an ICP-OES analyzer?

High-Throughput Analysis

On-Demand Webinar

High Throughput Analyses with ED-XRF

Data Analysis

On-Demand Webinar

Data Analysis in the Rearview Mirror - SPECTRO ICP Analyzer Pro Software

New SPECTROGREEN

On-Demand Webinar

The New SPECTROGREEN – the Perfect fit for Your ICP-OES Elemental Analysis Tasks

Quantitative Analysis of Low Amounts

On-Demand Webinar

Nondestructive Quantitative Analysis of low Amounts of Powder and Liquid Samples Using XRF

Gemstones

On-Demand Webinar

How to Analyze Gemstones Using ED-XRF Equipment

Adaptive Excitation

On-Demand Webinar

Benefits of Adaptive Excitation in ED-XRF

ICP-OES Plasma Observation Technologies

On-Demand Webinar

ICP-OES Plasma Observation Technologies and Their Application

Smart Background Correction

On-Demand Webinar

ICP-OES Smart Background Correction for Complex Matrices

Multiview Technology

On-Demand Webinar

ICP-OES: What Does Multiview Technology Mean?

ICP Analyzer Pro

On-Demand Webinar

ICP Analyzer Pro Software Demonstration

元素分析是勘探和采矿过程中最重要的调查手段之一。X射线荧光（ED-XRF）光谱仪为岩石、勘探样本、矿物、矿石、富集矿和尾矿的分析提供了方便快捷的方法，通常需要远少于其他技术的样本制备工作。

针对样品量大、要求分析时间短、尤其是轻元素检出限低，ICP-OES 等离子体发射光谱仪提供了所需性能。两种技术均可轻松实现自动化，不到两分钟即可完成样本分析，达到亚ppm（百万分之一）和ppb（十亿分之一）范围的检出限。